au.\*:("KANG, T. D")
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Rotatable broadband retarders for far-infrared spectroscopic ellipsometryKANG, T. D; STANDARD, E; CARR, G. L et al.Thin solid films. 2011, Vol 519, Num 9, pp 2698-2702, issn 0040-6090, 5 p.Conference Paper
GaN-based vertical cavities with crack-free high-reflectivity patterned AIGaN/GaN distributed Bragg reflectorsNI, X; SHIMADA, R; KANG, T. D et al.Physica status solidi. A, Applications and materials science (Print). 2009, Vol 206, Num 2, pp 367-370, issn 1862-6300, 4 p.Article
Ellipsometry on uniaxial ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrateKANG, T. D; LEE, Hosun; PARK, Won-Il et al.Thin solid films. 2004, Vol 455-56, pp 609-614, issn 0040-6090, 6 p.Conference Paper
